학술논문

Differential Read/Write 7T SRAM With Bit-Interleaved Structure for Near-Threshold Operation
Document Type
Periodical
Source
IEEE Access Access, IEEE. 9:64105-64115 2021
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Geoscience
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Random access memory
Energy consumption
Delays
Transistors
Circuit stability
Turning
7T bitcell
half-select issue
low energy consumption
near-threshold voltage
static random access memory (SRAM)
Language
ISSN
2169-3536
Abstract
Near-threshold voltage ( $V_{th}$ ) operation is an effective method for lowering energy consumption. However, it increases the impact of $V_{th}$ variation significantly, which makes it difficult for previously proposed static random access memory (SRAM) bitcells to achieve high read stability and write ability yields. To achieve these in the near- $V_{th}$ region, a differential 7T SRAM bitcell is proposed in which an additional row-based control signal and an nMOS transistor between the pull-up and pull-down transistors is adopted on one side of the cross-coupled inverter. In addition, the proposed SRAM bitcell can use a bit-interleaved structure without the half-select issue. Compared to differential 10T and 12T SRAM, the proposed differential 7T SRAM achieves 5% and 6% higher SRAM operating frequency and 70% and 23% lower operation energy consumption with a 33% and 49% smaller bitcell area, respectively.