부산대학교 도서관

The measurement needs for space and military industries are constantly evolving, and more often require the characterization of electrically large and multi-port antennas. Planar Near-Field systems (PNF) offer advantages over other test solutions, at the cost of longer acquisition time. The use of multi-probe technology to partially replace slow mechanical scanning is a proven solution to reduce the measurement time. In PNF systems, the effect of the probe must be compensated to achieve sufficient measurement accuracy. The standard calibration used in multi-probe systems provides equalized on- axis probe responses in amplitude/phase and polarization. The probe pattern is approximated from a separate calibration of the probe array elements before installation. Unfortunately, this approach can be time consuming and expensive. A novel technique to determine the multi-probe pattern for accurate PNF compensation is presented. The calibration process is explained and validated by experiment using measurements conducted in a recently installed planar multi-probe system.