학술논문
Spin resolved Imaging with Scanning Field-Emission Microscopy
Document Type
Conference
Author
Source
2018 31st International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2018 31st International. :1-2 Jul, 2018
Subject
Language
ISSN
2380-6311
Abstract
Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.