학술논문
Scanning THz Noise Microscopy of Operating Nano-devices
Document Type
Conference
Author
Source
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2018 43rd International Conference on. :1-2 Sep, 2018
Subject
Language
ISSN
2162-2035
Abstract
Electrical currents in operating nano-devices generate terahertz noise emission due to the rich ultrafast interactions of flowing charges with hosting lattices. With a newly developed scanning noise microscope (SNoiM) in terahertz range, we present here real-space imaging of hot carrier dissipation dynamics in long-channel GaAs operating nano-devices and discuss the associated nonequilibrium relaxation mechanisms.