학술논문

Fast Surface Defect Detection Using Improved Gabor Filters
Document Type
Conference
Source
2018 25th IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2018 25th IEEE International Conference on. :1508-1512 Oct, 2018
Subject
Computing and Processing
Signal Processing and Analysis
Surface cracks
Hysteresis
Surface treatment
Rough surfaces
Surface roughness
Standards
Surface texture
Defect Detection
Gabor Filters
Crack Detection
Surface Inspection
Language
ISSN
2381-8549
Abstract
Surface inspection and defect detection are essential procedures in the quality control of mass production. It is challenging to identify curvilinear defects on a complex background. This paper proposes a novel and fast surface defect detection method based on improved Gabor filters. The introduced system firstly employs improved Gabor filter banks to generate corresponding energy maps. Hysteresis thresholding combined with region grouping and pruning is used to extract defect regions, integrate defect fragments and remove false positives. Our method exhibits excellent performance on two different kinds of surface defect dataset and thus proves to be a practical and accurate solution to surface defect detection.