학술논문
EMC development process for information technology equipment
Document Type
Conference
Author
Source
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Electromagnetic compatibility - Seattle Electromagnetic Compatibility, 1999 IEEE International Symposium on. 1:121-126 vol.1 1999
Subject
Language
Abstract
Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, "market windows" that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company's overall product design strategy.