학술논문

Design of a MGy tolerant instrumentation amplifier using a correlated double sampling technique in 130 nm CMOS
Document Type
Conference
Source
2011 12th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on. :156-159 Sep, 2011
Subject
Fields, Waves and Electromagnetics
Nuclear Engineering
Photonics and Electrooptics
Components, Circuits, Devices and Systems
Power, Energy and Industry Applications
Noise
Gain
Capacitors
CMOS integrated circuits
Radiation effects
Switches
Noise level
Analog integrated circuits
Switched capacitor circuits
CMOS technology
Reactor instrumentation
Pressure gauges
Language
ISSN
0379-6566
Abstract
In this paper a radiation tolerant configurable instrumentation amplifier for use with resistive sensors, like strain gauge pressure sensors, is presented. The design features a 1.5 V differential amplifier, consuming 1.5 mW and utilizing a correlated double sampling technique (CDS) with a sample frequency of 20 kHz. The gain of the amplifier is digitally configurable between 27 and 400 and the input referred noise density equals 8.6 µV at room temperature. The circuit has a simulated radiation tolerance exceeding 1 MGy.