학술논문

Analyzing the Effects of TID in an Embedded System Running in a Flash-Based FPGA

Document Type

Periodical

Author

Tarrillo, J.; Azambuja, J. R.; Kastensmidt, F. L.; Fonseca, E. C. P.; Galhardo, R.; Goncalez, O.

Source

IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 58(6):2855-2862 Dec, 2011

Subject

Nuclear Engineering
Bioengineering
SRAM chips
Field programmable gate arrays
Microprocessors
Phase locked loops
System-on-a-chip
Embedded systems
Radiation effects
Embedded system
Flash-based FPGA
radiation effects
system on chip
total ionizing dose

Language

ISSN

0018-9499
1558-1578

Abstract

This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.

Online Access

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