학술논문
Impact of Background Noise on Dielectric Reconstructions Obtained by a Prototype of Microwave Axial Tomograph
Document Type
Periodical
Author
Source
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 61(1):140-148 Jan, 2012
Subject
Language
ISSN
0018-9456
1557-9662
1557-9662
Abstract
This paper investigates the influence of noise on a microwave axial tomograph developed by some of the authors for the inspection of dielectric objects. In particular, the impact of the measurement environment is considered and the images obtained from data measured in a controlled and an uncontrolled environment are presented and compared. Moreover, the effects of interference signals are considered. Accordingly, several experimental results are reported and discussed in terms of proper error parameters.