학술논문

Mode imaging and dispersion analysis in Terahertz waveguides using Terahertz near-field microscopy
Document Type
Conference
Source
2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on. :1-2 May, 2009
Subject
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Optical imaging
Image analysis
Microscopy
Optical waveguides
Coatings
Hollow waveguides
Dielectrics
Probes
Propagation losses
Thickness measurement
(110.6795) Terahertz imaging
(230.7370) Waveguides
Language
ISSN
2160-9004
Abstract
Mode structure, transmission loss and dispersion are characterized in low-loss (∼1dB/m) Terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing.