학술논문

Lateral carrier sweep-out in multi-quantum well optoelectronic devices
Document Type
Conference
Source
LEOS '95. IEEE Lasers and Electro-Optics Society 1995 Annual Meeting. 8th Annual Meeting. Conference Proceedings Lasers and electro-optics Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE. 2:295-296 vol.2 1995
Subject
Photonics and Electrooptics
Components, Circuits, Devices and Systems
Frequency response
Quantum well devices
Optoelectronic devices
PIN photodiodes
Thermionic emission
Charge carrier processes
Electron emission
Contacts
Potential energy
Geometry
Language
Abstract
The frequency response of multi-quantum well (MQW) optoelectronic devices is governed by the rate of carrier injection and removal from the active regions. In a conventional p-i-n structure vertical rate limiting carrier transport mechanism is primarily due to thermionic emission of holes and electrons from the quantum wells. However, in waveguide structures the p and n contacts can be in-diffused on either side of the waveguide. With an applied reverse electrical bias, lateral transport of the carriers by diffusion and drifting is accomplished without the need to overcome any energy potential barrier. Since the waveguide geometry can be very small (/spl sim/1 /spl mu/m), the time taken for the carriers to traverse that region is inherently fast and hence high speed devices can readily be achieved.