학술논문

A Comparison of the Lower Limit of Multiplication Noise in InP and InAlAs Based APDs for Telecommunications Receiver Applications
Document Type
Conference
Source
LEOS 2006 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE. :789-790 Oct, 2006
Subject
Photonics and Electrooptics
Components, Circuits, Devices and Systems
Indium phosphide
Indium compounds
Tunneling
Noise reduction
Impact ionization
Signal to noise ratio
III-V semiconductor materials
Noise figure
Bit error rate
Absorption
Language
ISSN
1092-8081
Abstract
In this work newly derived non-local ionization coefficients covering the required high field range have been used, together with a random path length model, to accurately evaluate multiplication and excess noise in both InP and InAlAs multiplication regions. The multiplication of both the intentionally injected photocurrent and the tunneling current has been modeled. A range of APD multiplication widths have been evaluated and APD performance has been combined with a modeled receiver front end, to interpret the results in terms of receiver sensitivity