학술논문
Layering of the STIL extensions
Document Type
Conference
Author
Source
IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :8 pp.-560 2005
Subject
Language
ISSN
1089-3539
2378-2250
2378-2250
Abstract
STIL consists of a series of standards under the IEEE 1450 label. Some of these efforts are approved, others in balloting, and others still being defined. This paper identifies the various efforts and discusses the motivations for the partitioning of these efforts. Industry concerns with this partitioning are presented, and an option to lower the barrier to acceptance for these efforts is identified.