학술논문
Critical Analysis of Bulk Current Injection (BCI) Testing Methods
Document Type
Conference
Source
2024 International Conference on Applied Electronics (AE) Applied Electronics (AE), 2024 International Conference on. :1-4 Sep, 2024
Subject
Language
ISSN
1805-9597
Abstract
In this paper, the two testing methods for bulk current injection (BCI) testing, the substitution and closed-loop method, are analyzed. It is critically questioned, if both methods can be seen as equivalent with regard to validation, test reproducibility and suitability for different types of equipment under test (EUT), when each method employ different location(s) of injection probes and different forward power application. For this analysis, a circuit model of the whole BCI setup for a frequency range from 1 MHz to 400 MHz was designed and verified by measurement, applying a constant current. Then, results of both methods are compared and it is assessed, if both methods can be seen as equivalent or one of the methods is more suitable for testing than the other.