학술논문

Review of Active Thermal Control for Power Electronics: Potentials, Limitations, and Future Trends
Document Type
Periodical
Source
IEEE Open Journal of Power Electronics IEEE Open J. Power Electron. Power Electronics, IEEE Open Journal of. 5:414-435 2024
Subject
Components, Circuits, Devices and Systems
Power, Energy and Industry Applications
Junctions
Thermal stresses
Reliability
Costs
Power electronics
Stress
Multichip modules
Active thermal control
junction temperature control
reliability enhancement
power electronics
semiconductor device lifetime
Language
ISSN
2644-1314
Abstract
The main factor that drives the aging of power semiconductor modules is the thermally induced stress caused by the maximum temperature and temperature swings. This thermally induced stress is usually counteracted in passive designs with oversizing of components, which brings additional cost to the system. This is a major limitation of future power electronic systems that are required to be more reliable with reasonable cost and for many applications to be lighter and smaller. Active thermal control (ATC) is a possibility to reduce the thermal stress of components during real-time operation without the need to modify the expensive converter power stage. Many studies have shown the potential of ATC to not only extend the lifetime of power converters because of the reduced stress, but also to increase the converter devices utilization by pushing them into their thermal limits with proper control. This makes ATC an appealing way to realize the contradicting reliability, cost, and power density requirements. This paper provides an overview of the benefits and objectives, structure, and implementation possibilities of ATC. It also provides and overview of the limitations and disadvantages of many ATC strategies. Based on this discussion, it highlights key issues that must be addressed by future research. Among them is minimizing the impact of different ATC strategies on the power losses, operational cost, and output voltage and current quality.