학술논문

Cryogenic InGaAs HEMTs with Reduced On-Resistance using Strained Ohmic Contacts
Document Type
Conference
Source
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Resistance
Cryogenics
HEMTs
Logic gates
Indium gallium arsenide
Ohmic contacts
MODFETs
Language
ISSN
2156-017X
Abstract
We present InGaAs HEMTs with optimized cryogenic Ohmic contacts, for low-power qubit readout. We utilize tensile strained contact metals to reduce the barrier resistance, which is a major fraction of R SD , leading to ∼50% reduction of R SD at low temperature. At 4 K, a ∼50% lower R ON is shown with tensile strained contacts and demonstrated contact resistance of 30.6 Ω • μm and R ON of 290 Ω • μm at L G = 130 nm, among the lowest reported values for cryogenic HEMT technology. As a result, the InGaAs HEMTs exhibit a record-low value of the noise indication factor$\sqrt {{I_{{\text{DS}}}}} /{g_{\text{m}}} = 0.18\sqrt {{\text{V}}\cdot {\text{mm}}/{\text{S}}} $, at the lowest DC power consumption reported in cryogenic low-noise HEMTs. RF measurements and small-signal model parameters are also presented. The results demonstrate that contact engineering is key to enhance the performance of cryogenic InGaAs HEMTs for future large-scale quantum computing applications.