학술논문

One-Transistor Ternary Content-Addressable Memory Based on Localized Ferroelectric Switching for Massive and Accurate Routing
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(2):144-147 Feb, 2024
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Logic gates
Computer architecture
Switches
Routing
Integrated circuit modeling
FeFETs
Performance evaluation
Ternary content-addressable memory (TCAM)
ferroelectric tunnel-field effect transistor (FeTFET)
ambipolar transistor
local polarization switching
Language
ISSN
0741-3106
1558-0563
Abstract
A novel one-transistor (1T) ternary content-addressable memory (TCAM) in which the don’t care state ‘X’ is implemented based on the localized ferroelectric polarization switching in the ambipolar ferroelectric tunnel field-effect transistors is proposed. Using local polarization switching scheme, two threshold voltages for forward and ambipolar modes are independently shifted to write ‘X’. Cell characteristics are experimentally demonstrated to be superior to conventional 1T TCAM implementation in terms of leakage current suppression and variation robustness. Consequently, the proposed 1T TCAM enables reliable in-memory search operations in massive arrays.