학술논문

Theoretical Limits of the Matching Bandwidth and Output Power of AlScN-Based HEMTs
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1670-1675 Mar, 2024
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Logic gates
MODFETs
HEMTs
Wide band gap semiconductors
Aluminum gallium nitride
Charge carrier density
Current density
AlScN
Bode–Fano limit
high-electron mobility transistor (HEMT)
ScAIN
Language
ISSN
0018-9383
1557-9646
Abstract
In this work, the simultaneously achievable matching bandwidth and output power of AlScN-based high electron mobility transistors (HEMTs) are derived and compared to conventional AlGaN, GaAs, and Si devices. Moll’s method is used to extract time delays resulting in carrier velocities close to $1\times 10^{{7}}$ cm/s for sheet carrier densities $\ge 1.5\times 10^{{13}}$ cm−2. Subsequently, theoretical current densities of 2.5–4 A/mm and a maximum transconductance higher than 600 mS/mm are derived for low barrier thicknesses of 5–10 nm and Sc-concentrations of 5%–20%. The matching bandwidth is estimated by the Bode–Fano criterion and connected to the output power of the transistor by the power-bandwidth product, which accounts for both parameters simultaneously. AlScN-based devices are found to exhibit a 4.5-times higher power-bandwidth product compared to conventional AlGaN-based HEMTs, quantifying the enormous, theoretical limits. Experimental data already show an improvement by a factor of 1.45 for AlScN-based devices, even in this early stage of development, which proves their superior properties, when aiming for wideband high-power millimeter-wave (mm-wave) devices.