부산대학교 도서관

Topology optimization for the design of electromagnetic (EM) devices has recently garnered significant interest, thanks to advancements in additive manufacturing techniques that enable the fabrication of intricate geometries. This has opened up new possibilities for using integral equation (IE) methods to solve EM problems, particularly in the analysis of inductive power transfer (IPT) devices. In this context, we introduce a novel topology optimization tool called TopIE, which is built upon the IE method for EM problem solutions. TopIE adopts the logic of topology optimization of binary structures (TOBSs), a sensitivity-based approach that leverages binary design variables to clearly differentiate the material properties within the design domain. The tool is specifically used for optimizing IPT devices, and sample implementations of the method are made publicly available. By combining the power of topology optimization and IE methods, TopIE offers a promising avenue for enhancing the design and performance of EM devices.