학술논문
Non-destructive Direct Pericarp Thickness Measurement of Sorghum Kernels with Fiber-based Extended Focus Optical Coherence Microscopy
Document Type
Conference
Author
Source
2023 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2023 Conference on. :1-2 May, 2023
Subject
Language
Abstract
We apply high-resolution Bessel-beam extended focus optical coherence microscopy for non-destructive morphological phenotyping of sorghum seeds. We obtain accurate thickness measurements with a reduced tendency to overestimate the thickness of thin phenotypes.