학술논문

Junction Diameter Dependence of Oscillation Frequency of GaN IMPATT Diode Up to 21 GHz
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(8):1328-1331 Aug, 2023
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Junctions
Current density
Semiconductor diodes
Resonant frequency
Gallium nitride
Power generation
Microwave oscillators
Gallium nitride (GaN)
vertical p-n diode
avalanche breakdown
impact ionization avalanche transit time (IMPATT) diode
microwave oscillation
Language
ISSN
0741-3106
1558-0563
Abstract
An experimental study on the effects of junction capacitance and current density on the oscillation characteristics of GaN single-drift-region (SDR) impact ionization avalanche transit-time (IMPATT) diodes were carried out using GaN p+-n abrupt junction diodes of various diameters, 200, 150, and $100 \mu \text{m}$ , with a depletion layer width of $2 \mu \text{m}$ . The fabricated diodes showed a clear avalanche breakdown at 315 V and a pulsed microwave oscillation with a peak output power exceeding 30 dBm. The oscillation frequency depended on junction diameter and current density. It was widely modulated from 8.56 to 21.1 GHz with decreasing junction diameter and increasing current density. The highest oscillation frequency was obtained with a current density of 13.8 kA/cm2 and a junction diameter of $100 \mu \text{m}$ . A numerical calculation based on Read-type small-signal theory was carried out and found to well explain the experimental results.