학술논문
PIPS Diode Test Setup for Heavy Ion Beam Spectral Characterization
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):1732-1739 Aug, 2023
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
In order to have an independent, repeatable, consistent, and flexible method to assess and compare heavy ion beams produced by different heavy ion irradiation facilities, a system has been developed in ESA laboratories to acquire and analyze the energy spectra of heavy ion beams. This system based on silicon detector is composed of a degrader system and detector to allow the acquisition of several measurement points. By coupling this measurement with simulation, it would be theoretically possible to identify an ion species.