학술논문

Power Loss Reduction of N-Channel 10-kV SiC IGBTs With Box Cell Layout
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(7):3768-3773 Jul, 2023
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Silicon carbide
Insulated gate bipolar transistors
Layout
Voltage
Conductivity
Modulation
Logic gates
10 kV
box cell layout
insulated-gate bipolar transistor (IGBT)
on-resistance
silicon carbide (SiC)
switching loss
Language
ISSN
0018-9383
1557-9646
Abstract
We investigated the power loss reduction of an n-channel 4H-silicon carbide (SiC) insulated-gate bipolar transistor (IGBT) with a blocking voltage of 10 kV by utilizing a box cell layout, which can enhance the conductivity modulation, instead of a conventional string cell layout. The box cell layout significantly reduced the on-voltage of SiC IGBTs, which are a 35% and 29% reduction in the specific differential on-resistance at 25 °C and 150 °C, respectively. Although enhancing the conductivity modulation should increase the turn-off loss, it has increased slightly, by 10% at 25 °C and by 5% at 150 °C with a load current of 250 A/cm 2 because the box cell layout can enhance the stored carrier, particularly near the emitter in the on-state. In contrast to the turn-off loss, turn-on loss was reduced by the box cell layout due to the enhancement of electron injection from the emitter, resulting in a lower total switching loss in comparison to a string-layout device. A lower on-voltage and switching loss of SiC IGBTs have both been achieved as a result of the box cell layout enhancing conductivity modulation enhancement.