학술논문
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory
Document Type
Conference
Author
Source
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Subject
Language
ISSN
1938-1891
Abstract
We prototyped a 228 KB oxide semiconductor memory utilizing field-effect transistors with a c-axis-aligned crystalline oxide semiconductor (CAAC-OSFETs) and evaluated its tolerance to hard errors caused by X-rays and soft errors caused by heavy-ion beams. Evaluation results demonstrate that the OS memory has radiation tolerance high enough to operate properly even in space radiation environments.