학술논문
Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser
Document Type
Working Paper
Author
Irvine, Sara J.; Katagiri, Kento; Ræder, Trygve M.; Boesenberg, Ulrike; Chalise, Darshan; Stanton, Jade I.; Pal, Dayeeta; Hallmann, Jörg; Ansaldi, Gabriele; Brauße, Felix; Eggert, Jon H.; Fang, Lichao; Folsom, Eric; Haubro, Morten; Holstad, Theodor S.; Madsen, Anders; Möller, Johannes; Nielsen, Martin M.; Poulsen, Henning F.; Pudell, Jan-Etienne; Rodriguez-Fernandez, Angel; Schoofs, Frank; Seiboth, Frank; Wang, Yifan; Jo, Wonhyuk; Youssef, Mohamed; Zozulya, Alexey; Haldrup, Kristoffer; Dresselhaus-Marais, Leora E.
Source
Subject
Language
Abstract
Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-{\mu}m spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatially 3D and 2D axial-strain scans with sub-{\mu}m spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of microstructures.