학술논문
Experimental Limits on Solar Reflected Dark Matter with a New Approach on Accelerated Dark Matter-Electron Analysis in Semiconductors
Document Type
Working Paper
Author
Zhang, Z. Y.; Yang, L. T.; Yue, Q.; Kang, K. J.; Li, Y. J.; An, H. P.; C., Greeshma; Chang, J. P.; Chen, Y. H.; Cheng, J. P.; Dai, W. H.; Deng, Z.; Fang, C. H.; Geng, X. P.; Gong, H.; Guo, Q. J.; Guo, T.; Guo, X. Y.; He, L.; He, S. M.; Hu, J. W.; Huang, H. X.; Huang, T. C.; Jiang, L.; Karmakar, S.; Li, H. B.; Li, H. Y.; Li, J. M.; Li, J.; Li, Q. Y.; Li, R. M. J.; Li, X. Q.; Li, Y. L.; Liang, Y. F.; Liao, B.; Lin, F. K.; Lin, S. T.; Liu, J. X.; Liu, S. K.; Liu, Y. D.; Liu, Y.; Liu, Y. Y.; Ma, H.; Mao, Y. C.; Nie, Q. Y.; Ning, J. H.; Pan, H.; Qi, N. C.; Ren, J.; Ruan, X. C.; Singh, M. K.; Sun, T. X.; Tang, C. J.; Tian, Y.; Wang, G. F.; Wang, J. Z.; Wang, L.; Wang, Q.; Wang, Y. F.; Wang, Y. X.; Wong, H. T.; Wu, S. Y.; Wu, Y. C.; Xing, H. Y.; Xu, R.; Xu, Y.; Xue, T.; Yan, Y. L.; Yi, N.; Yu, C. X.; Yu, H. J.; Yue, J. F.; Zeng, M.; Zeng, Z.; Zhang, B. T.; Zhang, F. S.; Zhang, L.; Zhang, Z. H.; Zhao, J. Z.; Zhao, K. K.; Zhao, M. G.; Zhou, J. F.; Zhou, Z. Y.; Zhu, J. J.
Source
Subject
Language
Abstract
Recently a Dark Matter-electron (DM-e) paradigm has drawn much attention. Models beyond the Standard Halo Model describing DM accelerated by high energy celestial bodies are under intense examination as well. In this letter, a Velocity Component Analysis method dedicated to swift analysis of Accelerated DM-electron interactions via semiconductor detectors is proposed and the first HPGe detector-based Accelerated DM-electron analysis is realized. Utilizing the method, the first germanium based constraint on sub-GeV Solar Reflected DM-electron interaction is presented with the 205.4 kg$\cdot$day dataset from the CDEX-10 experiment. In the heavy mediator scenario, the result excels in the mass range of 5$-$15 keV/$c^2$, achieving a three orders of magnitude improvement comparing with previous semiconductor experiments. In the light mediator scenario, the strongest constraint for DM lighter than 0.1 MeV/$c^2$ is presented. The result proves the feasibility and demonstrates the vast potential of the Velocity Component Analysis technique in future Accelerated DM-electron analysis with semiconductor detectors.
Comment: 6 pages, 4 figures. Minor improvements, references added
Comment: 6 pages, 4 figures. Minor improvements, references added