학술논문
Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
Document Type
Working Paper
Author
Carnesecchi, F.; Sabiu, B.; Strazzi, S.; Vignola, G.; Agrawal, N.; Alici, A.; Antonioli, P.; Arcelli, S.; Bellini, F.; Cavazza, D.; Cifarelli, L.; Colocci, M.; Durando, S.; Ercolessi, F.; Falchieri, D.; Ficorella, A.; Fraticelli, C.; Garbini, M.; Giacalone, M.; Gola, A.; Hatzifotiadou, D.; Jacazio, N.; Margotti, A.; Malfattore, G.; Nania, R.; Noferini, F.; Paternoster, G.; Pinazza, O.; Preghenella, R.; Rath, R.; Ricci, R.; Rignanese, L.; Romanenko, G.; Rubini, N.; Scapparone, E.; Scioli, G.; Zichichi, A.
Source
Subject
Language
Abstract
In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.