학술논문
Understanding the direct detection of charged particles with SiPMs
Document Type
Working Paper
Author
Carnesecchi, F.; Vignola, G.; Agrawal, N.; Alici, A.; Antonioli, P.; Arcelli, S.; Bellini, F.; Cavazza, D.; Cifarelli, L.; Colocci, M.; Durando, S.; Ercolessi, F.; Ficorella, A.; Fraticelli, C.; Garbini, M.; Giacalone, M.; Gola, A.; Hatzifotiadou, D.; Jacazio, N.; Margotti, A.; Malfattore, G.; Nania, R.; Noferini, F.; Paternoster, G.; Pinazza, O.; Preghenella, R.; Rath, R.; Ricci, R.; Rignanese, L.; Rubini, N.; Sabiu, B.; Scapparone, E.; Scioli, G.; Strazzi, S.; Tripathy, S.; Zichichi, A.
Source
Subject
Language
Abstract
In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.