학술논문
Surface structure of Bi2Se3(111) determined by low-energy electron diffraction and surface X-ray diffraction
Document Type
Working Paper
Author
Reis, Diogo Duarte dos; Barreto, Lucas; Bianchi, Marco; Ribeiro, Guilherme Almeida Silva; Soares, Edmar Avellar; Silva, Wendell Simoes e; de Carvalho, Vagner Eustaquio; Rawle, Jonathan; Hoesch, Moritz; Nicklin, Chris; Fernandes, Willians Principe; Mi, Jianli; Iversen, Bo Brummerstedt; Hofmann, Philip
Source
Subject
Language
Abstract
The surface structure of the prototypical topological insulator Bi2Se3 is determined by low-energy electron diffraction and surface X-ray diffraction at room temperature. Both approaches show that the crystal is terminated by an intact quintuple layer. Specifically, an alternative termination by a bismuth bilayer is ruled out. Surface relaxations obtained by both techniques are in good agreement with each other and found to be small. This includes the relaxation of the van der Waals gap between the first two quintuple layers.