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THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy

Document Type

Article

Author

Marczewski, J.; Coquillat, D.; Knap, W.; Kolacinski, C.; Kopyt, P.; Kucharski, K.; Lusakowski, J.; Obrebski, D.; Tomaszewski, D.; Yavorskiy, D.; Zagrajek, P.; Ryniec, R.; Palka, N.

Source

In Opto-Electronics Review December 2018 26(4):261-269

Subject

Language

ISSN

1230-3402

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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