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A new X-ray beam induced current setup, coupled with X-ray diffraction imaging, for diamonds and semiconductors characterization by synchrotron techniques at ESRF

Document Type

Article

Author

Lafont, F.; Baruchel, J.; Bousquet, J.; Capria, E.; Celestre, R.; Cotte, M.; Dauvergne, D.; Everaere, P.; Gallin-Martel, M.L.; Hoarau, C.; Ibourk, O.; Letellier, J.; Molle, R.; Muraz, J.-F.; Nusimovici, D.Z.; Reynaud, M.; Tran-Caliste, T.N.

Source

In Diamond & Related Materials December 2023 140 Part B

Subject

Language

ISSN

0925-9635

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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