학술논문
A measurement of ψ(2S) resonance parameters
Document Type
Short Communication
Author
Bai, J.Z; Ban, Y; Bian, J.G; Blum, I; Cai, X; Chang, J.F; Chen, H.F; Chen, H.S; Chen, J; Chen, Jie; Chen, J.C; Chen, Y.B; Chi, S.P; Chu, Y.P; Cui, X.Z; Dai, Y.S; Dong, L.Y; Du, Z.Z; Dunwoodie, W; Fang, J; Fang, S.S; Fu, H.Y; Fu, L.P; Gao, C.S; Gao, Y.N; Gong, M.Y; Gratton, P; Gu, S.D; Guo, Y.N; Guo, Y.Q; Guo, Z.J; Han, S.W; Harris, F.A; He, J; He, K.L; He, M; He, X; Heng, Y.K; Hong, T; Hu, H.M; Hu, T; Huang, G.S; Huang, X.P; Izen, J.M; Ji, X.B; Jiang, C.H; Jiang, X.S; Jin, D.P; Jin, S; Jin, Y; Jones, B.D; Ke, Z.J; Kong, D; Lai, Y.F; Li, G; Li, H.H; Li, J; Li, J.C; Li, Q.J; Li, R.Y; Li, W; Li, W.G; Li, X.Q; Liu, C.F; Liu, F; Liu, H.M; Liu, J.P; Liu, R.G; Liu, T.R; Liu, Y; Liu, Z.A; Liu, Z.X; Lou, X.C; Lowery, B; Lu, G.R; Lu, F; Lu, H.J; Lu, J.G; Lu, Z.J; Luo, X.L; Ma, E.C; Ma, F.C; Ma, J.M; Malchow, R; Mao, Z.P; Meng, X.C; Mo, X.H; Nie, J; Nie, Z.D; Olsen, S.L; Paluselli, D; Pan, L.J; Panetta, J; Peng, H.P; Porter, F; Qi, N.D; Qian, C.D; Qiu, J.F; Rong, G; Shen, D.L; Shen, H; Shen, X.Y; Sheng, H.Y; Shi, F; Standifird, J; Sun, H.S; Sun, S.S; Sun, Y.Z; Tang, X; Tian, D; Toki, W; Tong, G.L; Varner, G.S; Wang, J; Wang, J.Z; Wang, L; Wang, L.S; Wang, M; Wang, Meng; Wang, P; Wang, P.L; Wang, W.F; Wang, Y.F; Wang, Y.Y; Wang, Z; Wang, Zheng; Wang, Z.Y; Weaver, M; Wei, C.L; Wu, N; Xia, X.M; Xie, X.X; Xu, G.F; Xu, Y; Xue, S.T; Yan, M.L; Yan, W.B; Yang, C.Y; Yang, G.A; Yang, H.X; Ye, M.H; Ye, S.W; Ye, Y.X; Ying, J; Yu, C.S; Yu, G.W; Yuan, C.Z; Yuan, J.M; Yuan, Y; Yue, Q; Zeng, Y; Zhang, B.X; Zhang, B.Y; Zhang, C.C; Zhang, D.H; Zhang, H.Y; Zhang, J; Zhang, J.W; Zhang, L; Zhang, L.S; Zhang, Q.J; Zhang, S.Q; Zhang, X.Y; Zhang, Y.Y; Zhang, Yiyun; Zhang, Z.P; Zhao, D.X; Zhao, Jiawei; Zhao, J.W; Zhao, P.P; Zhao, W.R; Zhao, Y.B; Zhao, Z.G; Zheng, J.P; Zheng, L.S; Zheng, Z.P; Zhong, X.C; Zhou, B.Q; Zhou, G.M; Zhou, L; Zhu, K.J; Zhu, Q.M; Zhu, Y.C; Zhu, Y.S; Zhu, Z.A; Zhuang, B.A; Zou, B.S
Source
In Physics Letters B 12 December 2002 550(1-2):24-32
Subject
Language
ISSN
0370-2693