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Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors

Document Type

Article

Author

Kroll, J.; Allport, P.P.; Chisholm, A.; Dudáš, D.; Fadeyev, V.; George, W.; Gonella, L.; Kopsalis, I.; Kvasnička, J.; Latoňová, V.; Lomas, J.; Martinez-Mckinney, F.; Mikeštíková, M.; Shi, X.; Tůma, P.; Ullan, M.; Unno, Y.

Source

In Nuclear Inst. and Methods in Physics Research, A February 2023 1047

Subject

Language

ISSN

0168-9002

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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