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Raman investigation of GaP–Si interfaces grown by molecular beam epitaxy

Document Type

Article

Author

Bondi, A.; Cornet, C.; Boyer, S.; Nguyen Thanh, T.; Létoublon, A.; Pedesseau, L.; Durand, O.; Moreac, A.; Ponchet, A.; Le Corre, A.; Even, J.

Source

In Thin Solid Films 31 August 2013 541:72-75

Subject

Language

ISSN

0040-6090

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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