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Elucidating the large variation in ion diffusivity of microelectronic packaging materials

Document Type

Article

Author

Herrmann, A.; van Soestbergen, M.; Erich, S.J.F.; van der Ven, L.G.J.; Huinink, H.P.; van Driel, W.D.; Mavinkurve, A.; De Buyl, F.; Adan, O.C.G.

Source

In Microelectronics Reliability September 2022 136

Subject

Language

ISSN

0026-2714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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