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Stability and degradation of isolation and surface in Ga2O3 devices

Document Type

Article

Author

De Santi, C.; Nardo, A.; Wong, M.H.; Goto, K.; Kuramata, A.; Yamakoshi, S.; Murakami, H.; Kumagai, Y.; Higashiwaki, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.

Source

In Microelectronics Reliability September 2019 100-101

Subject

Language

ISSN

0026-2714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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