부산대학교 도서관

Publisher Summary This chapter provides the general procedure and method for a correlation test of electromagnetic radiation and injection for microelectronic devices. Devices choosing, working circuit designing, radiation test methods and relational parameters testing, and correlation evaluating are introduced and analyzed in detail. In the past, direct injection method has been used for an assessment of the susceptibility of electronic devices to electromagnetic pulse (EMP), that is, electrostatic discharge (ESD) pulse, rectangular pulse, or damped sinusoid is injected into sensitive pins of isolated devices to evaluate the damage threshold of voltage. In injection method, devices are commonly in nonworking condition, but in fact, devices are interfered or damaged by EMP field when devices are in working condition. Some research results show that devices in working condition are much more sensitive to EMP than that of nonworking condition. The studying correlation of direct injection and radiation coupling is very important for evaluating EMP radiation immunity of devices in working condition and for studying EMP protection technology further.