학술논문
Phase imaging dislocations using diffracted beam interferometry.
Document Type
Article
Author
Source
Subject
*PHASE-shifting interferometry
*ELECTRONS
*INTERFEROMETRY
*
*
Language
ISSN
2050-5698
Abstract
A phase imaging method that measures the phase shift existing at a dislocation's core is described. The method uses the interference of two symmetrically diffracted beams on the optic axis by means of an electron biprism. Each diffracted beam carries half the phase of the dislocation core. When combined, the entire phase shift of the dislocation core is obtained. [ABSTRACT FROM AUTHOR]