학술논문
Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift.
Document Type
Article
Source
Subject
*ION analysis
*ION beams
*ELECTROSTATIC separation
*NUCLIDES
*MASS spectrometers
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*
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Language
ISSN
1387-3806
Abstract
A method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online measurements on short-lived nuclides performed with ISOLTRAP at ISOLDE/CERN. [ABSTRACT FROM AUTHOR]