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Digging deeper: Buried layers and interfaces studied by modified total electron yield and soft x-ray absorption spectroscopy

Document Type

Journal

Author

Kroeger, E.; Petraru, A.; Hanff, A.; Soni, R.; Kallaene, M.; Denlinger, J. D.; Learmonth, T.; Guo, J. -H.; Smith, K. E.; Schneller, T.; Freelon, B.; Kipp, L.; Kohlstedt, H.; Rossnagel, K.; Kolhatkar, G.

Source

APPLIED PHYSICS LETTERS; MAY 2 2022, 120 18, p181601 6p.

Subject

Language

English

ISSN

10773118

Online Access

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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