학술논문
'학술논문'
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Academic Journal
Kozuma, M.; Komura, Y.; Miyata, S.; Okamoto, Y.; Tamatsukuri, Y.; Inoue, H.; Saito, T.; Kobayashi, H.; Onuki, T.; Yanagisawa, Y.; Takeuchi, T.; Okazaki, Y.; Kunitake, H.; Nakamura, D.; Nagata, T.; Yamane, Y.; Ikeda, M.; Yamazaki, S.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:187-194 2024
Academic Journal
Agrawal, S; Buyan, A; Severin, J; Koido, M; Alam, T; Abugessaisa, I; Chang, HY; Dostie, J; Itoh, M; Kere, J; Kondo, N; Li, Y; Makeev, VJ; Mendez, M; Okazaki, Y; Ramilowski, JA; Sigorskikh, AI; Strug, LJ; Yagi, K; Yasuzawa, K; Yip, CW; Hon, CC; Hoffman, MM; Terao, C; Kulakovskiy, IV; Kasukawa, T; Shin, JW; Carninci, P; de Hoon, MJL
PloS one. 19(5):e0295971
Academic Journal
Journal of High Energy Physics. 2024(5)
Academic Journal
Journal of High Energy Physics. 2024(5)
Academic Journal
Nakamura, S.; Matsumaru, D.; Yamahata, G.; Oe, T.; Okazaki, Y.; Takada, S.; Maruyama, M.; Fujiwara, A.; Kaneko, N.
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-9 2023
Academic Journal
IEEE Access Access, IEEE. 11:108716-108726 2023
Academic Journal
Ramilowski, JA; Yip, CW; Agrawal, S; Chang, JC; Ciani, Y; Kulakovskiy, IV; Mendez, M; Ooi, JL; Ouyang, JF; Parkinson, N; Petri, A; Roos, L; Severin, J; Yasuzawa, K; Abugessaisa, I; Akalin, A; Antonov, IV; Arner, E; Bonetti, A; Bono, H; Borsari, B; Brombacher, F; Cameron, CJF; Cannistraci, CV; Cardenas, R; Cardon, M; Chang, HW; Dostie, J; Ducoli, L; Favorov, A; Fort, A; Garrido, D; Gil, N; Gimenez, J; Guler, R; Handoko, L; Harshbarger, J; Hasegawa, A; Hasegawa, Y; Hashimoto, K; Hayatsu, N; Heutink, P; Hirose, T; Imada, EL; Itoh, M; Kaczkowski, B; Kanhere, A; Kawabata, E; Kawaji, H; Kawashima, T; Kelly, ST; Kojima, M; Kondo, N; Koseki, H; Kouno, T; Kratz, A; Kurowska-Stolarska, M; Kwon, ATJ; Leek, J; Lennartsson, A; Lizio, M; Lopez-Redondo, F; Luginbuhl, J; Maeda, S; Makeev, VJ; Marchionni, L; Medvedeva, YA; Minoda, A; Muller, F; Munoz-Aguirre, M; Murata, M; Nishiyori, H; Nitta, KR; Noguchi, S; Noro, Y; Nurtdinov, R; Okazaki, Y; Orlando, V; Paquette, D; Parr, CJC; Rackham, OJL; Rizzu, P; Martinez, DFS; Sandelin, A; Sanjana, P; Semple, CAM; Shibayama, Y; Sivaraman, DM; Suzuki, T; Szumowski, SC; Tagami, M; Taylor, MS; Terao, C; Thodberg, M; Thongjuea, S; Tripathi, V; Ulitsky, I; Verardo, R; Vorontsov, IE; Yamamoto, C; Young, RS; Baillie, JK; Forrest, ARR; Guigo, R; Hoffman, MM; Hon, CC; Kasukawa, T; Kauppinen, S; Kere, J; Lenhard, B; Schneider, C; Suzuki, H; Yagi, K; de Hoon, MJL; Shin, JW; Carninci, P
Genome research. 30(7):1060-1072
Academic Journal
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 32(6):1-5 Sep, 2022
Academic Journal
The European Physical Journal C: Particles and Fields. 84(3)
Academic Journal
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 32(6):1-4 Sep, 2022
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