학술논문
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Academic Journal
Mirian, C; Jensen, LR; Juratli, TA; Maier, AD; Torp, SH; Shih, HA; Morshed, RA; Young, JS; Magill, ST; Bertero, L; Stummer, W; Spille, DC; Brokinkel, B; Oya, S; Miyawaki, S; Saito, N; Proescholdt, M; Kuroi, Y; Gousias, K; Simon, M; Moliterno, J; Prat-Acin, R; Goutagny, S; Prabhu, VC; Tsiang, JT; Wach, J; Guresir, E; Yamamoto, J; Kim, YZ; Lee, JH; Koshy, M; Perumal, K; Baskaya, MK; Cannon, DM; Shrieve, DC; Suh, CO; Chang, JH; Kamenova, M; Straumann, S; Soleman, J; Eyupoglu, IY; Catalan, T; Lui, AS; Theodosopoulos, PV; Mcdermott, MW; Wang, F; Guo, FY; Goes, P; Neto, MAD; Jamshidi, A; Komotar, R; Ivan, M; Luther, E; Souhami, L; Guiot, MC; Csonka, T; Endo, T; Barrett, OC; Jensen, R; Gupta, T; Patel, AJ; Klisch, TJ; Kim, JW; Maiuri, F; Barresi, V; Tabernero, MD; Skyrman, S; Broechner, A; Bach, MJ; Law, I; Scheie, D; Kristensen, BW; Munch, TN; Meling, T; Fugleholm, K; Blanche, P; Mathiesen, T
Journal of neuro-oncology. 166(3):503-511
Conference
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020
Electronic Resource
Mirian, Christian; Jensen, Lasse Rehné; Juratli, Tareq A.; Maier, Andrea Daniela; Torp, Sverre H.; Shih, Helen A.; Morshed, Ramin A.; Young, Jacob S.; Magill, Stephen T.; Bertero, Luca; Stummer, Walter; Spille, Dorothee Cäcilia; Brokinkel, Benjamin; Oya, Soichi; Miyawaki, Satoru; Saito, Nobuhito; Proescholdt, Martin; Kuroi, Yasuhiro; Gousias, Konstantinos; Simon, Matthias; Moliterno, Jennifer; Prat-Acin, Ricardo; Goutagny, Stéphane; Prabhu, Vikram C.; Tsiang, John T.; Wach, Johannes; Güresir, Erdem; Yamamoto, Junkoh; Kim, Young Zoon; Lee, Joo Ho; Koshy, Matthew; Perumal, Karthikeyan; Baskaya, Mustafa K.; Cannon, Donald M.; Shrieve, Dennis C.; Suh, Chang Ok; Chang, Jong Hee; Kamenova, Maria; Straumann, Sven; Soleman, Jehuda; Eyüpoglu, Ilker Y.; Catalan, Tony; Lui, Austin; Theodosopoulos, Philip V.; McDermott, Michael W.; Wang, Fang; Guo, Fuyou; Góes, Pedro; de Paiva Neto, Manoel Antonio; Jamshidi, Aria; Komotar, Ricardo; Ivan, Michael; Luther, Evan; Souhami, Luis; Guiot, Marie Christine; Csonka, Tamás; Endo, Toshiki; Barrett, Olivia Claire; Jensen, Randy; Gupta, Tejpal; Patel, Akash J.; Klisch, Tiemo J.; Kim, Jun Won; Maiuri, Francesco; Barresi, Valeria; Tabernero, María Dolores; Skyrman, Simon; Broechner, Anders; Bach, Mathias Jacobsen; Law, Ian; Scheie, David; Kristensen, Bjarne Winther; Munch, Tina Nørgaard; Meling, Torstein; Fugleholm, Kåre; Blanche, Paul; Mathiesen, Tiit
Mirian , C , Jensen , L R , Juratli , T A , Maier , A D , Torp , S H , Shih , H A , Morshed , R A , Young , J S , Magill , S T , Bertero , L , Stummer , W , Spille , D C , Brokinkel , B , Oya , S , Miyawaki , S , Saito , N , Proescholdt , M , Kuroi , Y , Gousias , K , Simon , M , Moliterno , J , Prat-Acin , R , Goutagny , S , Prabhu , V C , Tsiang , J T , Wach , J , Güresir , E , Yamamoto , J , Kim , Y Z , Lee , J H , Koshy , M , Perumal , K , Baskaya , M K , Cannon , D M , Shrieve , D C , Suh , C O , Chang , J H , Kamenova , M , Straumann , S , Soleman , J , Eyüpoglu , I Y , Catalan , T , Lui , A , Theodosopoulos , P V , McDermott , M W , Wang , F , Guo , F , Góes , P , de Paiva Neto , M A , Jamshidi , A , Komotar , R , Ivan , M , Luther , E , Souhami , L , Guiot , M C , Csonka , T , Endo , T , Barrett , O C , Jensen , R , Gupta , T , Patel , A J , Klisch , T J , Kim , J W , Maiuri , F , Barresi , V , Tabernero , M D , Skyrman , S , Broechner , A , Bach , M J , Law , I , Scheie , D , Kristensen , B W , Munch , T N , Meling , T , Fugleholm , K , Blanche , P & Mathiesen , T 2024 , ' The importance of considering competing risks in recurrence analysis of intracranial meningioma ' , Journal of Neuro-Oncology , pp. 503–511 .
Conference
2012 24th International Symposium on Power Semiconductor Devices and ICs Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on. :205-208 Jun, 2012
Conference
2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on. :344-347 May, 2011
Conference
Ishibashi, M.; Kawasaki, Y.; Horita, K.; Kuroi, T.; Yamashita, T.; Shiga, K.; Hayashi, T.; Togawa, M.; Eimori, T.; Ohji, Y.
Extended Abstracts of the Fifth International Workshop on Junction Technology Junction Technology Junction Technology, 2005. Extended Abstracts of the Fifth International Workshop on. :35-38 2005
Conference
The 17th Annual SEMI/IEEE ASMC 2006 Conference Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE. :172-176 2006
Conference
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. Solid-state and integrated circuits technology Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on. 1:548-553 vol.1 2004
Conference
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :141-144 1998
Conference
International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :821-824 1996
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