학술논문
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2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024
Academic Journal
Peel, JN; Yang, R; Le Voyer, T; Gervais, A; Rosain, J; Bastard, P; Behere, A; Cederholm, A; Bodansky, A; Seeleuthner, Y; Conil, C; Ding, JY; Lei, WT; Bizien, L; Soudee, C; Migaud, M; Ogishi, M; Yatim, A; Lee, DY; Bohlen, J; Perpoint, T; Perez, L; Messina, F; Genet, R; Karkowski, L; Blot, M; Lafont, E; Toullec, L; Goulvestre, C; Mehlal-Sedkaoui, S; Sallette, J; Martin, F; Puel, A; Jouanguy, E; Anderson, MS; Landegren, N; Tiberghien, P; Abel, L; Boisson-Dupuis, S; Bustamante, J; Ku, CL; Casanova, JL
The Journal of clinical investigation. 134(8)
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3761-3768 Jun, 2024
Academic Journal
Sèvres. Revue de la Société des Amis du musée national de Céramique 32(1):22-29
Academic Journal
IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 60(1):1938-1945 Jan, 2024
Academic Journal
Audrey Dupuis (ORCID 0000-0001-9287-7114 ); Danyka Therriault; Julie Lane; Jonathan Smith; Patrick Gosselin; Martin Drapeau; Eliane Saint-Pierre Mousset; Pascale Morin (ORCID 0000-0002-0643-8068 ); Isabelle Thibault; Magali Dufour; Chantal Viscogliosi; Félix Berrigan
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