학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 1,512건 | 목록 1~10
Conference
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :104-109 Oct, 2023
Conference
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :184-188 Oct, 2023
Report
2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), Rome, Italy, 2022, pp. 585-590
Report
2023 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), Milano, Italy, 2023, pp. 184-188
Report
2023 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), Milano, Italy, 2023, pp. 104-109
Academic Journal
Verónica Chuts-Pérez (ORCID 0000-0002-0083-9354); Rosa Pilar Esteve-Faubel (ORCID 0000-0001-7221-8859); María Pilar Aparicio-Flores (ORCID 0000-0001-8043-4877); José María Esteve-Faubel (ORCID 0000-0001-9769-1351)
Journal of New Approaches in Educational Research. 2024 13(1).
Academic Journal
José M. Ortiz-Lozano (ORCID 0000-0002-8317-4393); Pilar Aparicio-Chueca (ORCID 0000-0002-4697-5124); Xavier M. Triadó-Ivern (ORCID 0000-0002-4938-6878); Jose Luis Arroyo-Barrigüete (ORCID 0000-0002-3660-3933)
Studies in Higher Education. 2024 49(8):1303-1316.
Conference
2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2022 IEEE International Conference on. :568-573 Oct, 2022
Conference
2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2022 IEEE International Conference on. :585-590 Oct, 2022
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제한된 항목
[Author] Aparicio, Pilar
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