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Academic Journal
Magee, L.A.; von Dadelszen, P.; Tohill, S.; Kirkham, K.; Evans, R.; Gkini, E.; Moakes, C.A.; Stubbs, C.; Thornton, J.; Brocklehurst, P.; Chappell, L.; Dorling, J.; Green, M.; Hardy, P.; Hutcheon, J.; Moakes, C.; Mol, B.W.; Morris, K.; Riley, P.; Roberts, T.; Scott, J.; Singer, J.; Unstead-Joss, R.; Wade, J.; Draycott, T.; MacLennan, G.; MacKillop, L.; Mannix, P.; Elbourne, D.; Groen, H.; Murdoch, E.; Stock, S.; Bhuiya, S.; Nallapeta, S.; Dooks, E.; Packham, S.; Whitehouse, D.; O’Hara, C.; Weston, C.; Mellers, D.; Brittain, L.; Adams, P.; Shakespeare, R.; Kakara, S.; Wright, J.; Mighell, A.; Syson, J.; Swettenham, K.; Eedle, J.; Seraj, S.; Bray, M.; Jones, B.; Bertorelli, C.; Ritter, H.; Keeping, V.; Cresswell, J.; Kelly-Baxter, M.; Yeoh, L.-S.; Bhansali, S.S.; More, V.; Ajay, B.; Upson, G.; Hake, D.; Opoku, D.; Wayman, E.; Cwiek, N.; Tregellas, S.; Lee, N.; Margarit, L.; Pike, J.; Jones, K.; Wheeler-Davies, S.-M.; Ali, M.; Rajkumar, I.; Habibi, R.; Davies, S.; Kumar, A.; Salian, H.; Smith, T.; Meneni, D.; Alexander, H.; Harwood, H.; Hebbron, K.; Whitecross, L.; Hodgers, M.; Mahadasu, S.; Kametas, N.; Sana, Y.; Martin, H.; Jarman, R.; Webster, S.; Rajeswary, J.; Gill, M.; Bambridge, G.; Bradley, I.; Sexton, K.; Oshodi, L.; Wiesender, C.; Dodd, C.; Modi, R.; Cowlishaw, B.; Mulheron, G.; Kierzenkowska, M.; Patterson, M.; Amos, P.; Bates, S.M.; Raper, S.; Agarwal, U.; Cockerill, R.; Mahdi, A.; Cunningham, C.; Dower, M.; Andrews, S.; Holt, S.; Williams, C.; Castling, Z.; Watkins, L.; Churchill, D.; McKenzie, E.; Icke, J.; Devison, L.; Raheja, V.; Ayuk, A.; Reynolds, J.; Wyton, J.; Duffy, S.; Walker, K.; Cantliffe, J.; Hussain, C.; Smith, C.; Anderson, H.; Hodgen, L.; Brackley, K.; Martin, N.; Walbridge, F.; Hampton, R.; Jones, N.; Bose, P.; Young, C.; Lee, F.; Peart, R.; Tanton, E.; Rhead, K.; Fiedler, K.; Bowen, R.; Mathen, S.; Sarwar, Z.; Rishton, C.; Scott, C.; Farey, J.; Verasingam, N.; Rich, M.; Moreton, A.; Bressington, C.; Pullen, J.; Burnard, S.; Duberry, W.; Dey, M.; Jones, S.; Bird, P.; Ullal, A.; Walton, E.; Price, A.; Scollen, J.; Ormonde, J.; Herdman, K.; Hewitt, L.; Rowland, L.; Singh, M.; Raajkumar, S.; Saji, B.; Khalil, A.; Perry, A.; Marler, E.; Imuzeze, I.; Robinson, S.; Nelson, J.; McNamara, K.; Craig, C.; Endersby, D.; Wagstaff, J.; Robinson, K.; Barnes, H.; Gavin, J.; Myers, J.; Stanbury, K.; Hughes, C.; Vinayakarao, L.; Melson, L.; Grigsby, S.; Blunden, S.; Griffin, M.; Newell, S.; Thompson, K.J.; Smart, B.; Payne, E.; Pitchford, M.; Khan, R.; Stone, S.; Elgarhy, A.; Meadows, E.; Flynn-Batham, M.; Passmore, N.; Cannons, V.; Symington, D.; Lewin, A.; Tarft, H.; Hunt, J.; Vowles, Z.; Slaney, M.; Woodcock, R.; Van der Meer, A.; Benn, T.; Davies, R.; Boyd, S.; Waring, G.; Riches, J.; Fenn, A.; Kimber, A.; Harrop, S.; Stott, D.; Tetteh, A.; Casagrandi, D.; Bourke, M.; Vaikousi, E.; Sarquis, R.; Folorunsho, M.; Newth, O.; Weist, S.; Acheampong, Y.; Ravikumar, V.; Yorke, J.; Atkinson, V.; Wood, S.; Mengistu, T.; Chadwick, R.; Haden, H.; Richardson, L.; Girling, J.; Barker, A.; Day, A.; Palmer, E.; Page, L.; Nwandison, M.; Osakwe, O.; de Rosnay, P.; Usman, S.; Barnes, S.; Ryan, G.; Lal, K.; Trepte, L.; Steele, S.; Tang, J.; Pearson, H.; Ingham, J.; Spark, N.
In: Trials . (Trials, 01 December 2022, 23(1))
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2023. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 2023, 2023-July)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2022. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 2022, 2022-July)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2021. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 2021, 2021-September)
Academic Journal
In: Current Applied Physics . (Current Applied Physics, 2014, 14(1):23-29)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 20 July 2020, 2020-July)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2019. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, July 2019)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , IPFA 2018 - 25th International Symposium on the Physical and Failure Analysis of Integrated Circuits. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 30 August 2018, 2018-July)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2017. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 5 October 2017, 2017-July:1-4)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2016. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 9 September 2016, 2016-September:22-25)
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[AR] Yeoh, L.-S.
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