학술논문
'학술논문'
에서 검색결과 142건 | 목록
1~10
Conference
Worledge, D. C.; Safranski, C.; Hu, G.; Sun, J. Z.; Hashemi, P.; Brown, S. L.; Buzi, L.; D'Emic, C. P.; Gottwald, M. G.; Gunawan, O.; Jung, H.; Karimeddiny, S.; Kim, J.; Trouilloud, P. L.
2022 IEEE 33rd Magnetic Recording Conference (TMRC) Magnetic Recording Conference (TMRC), 2022 IEEE 33rd. :1-2 Aug, 2022
Conference
Hu, G.; Safranski, C.; Sun, J. Z.; Hashemi, P.; Brown, S. L.; Bruley, J.; Buzi, L.; D'Emic, C. P.; Galligan, E.; Gottwald, M. G.; Gunawan, O.; Lee, J.; Karimeddiny, S.; Trouilloud, P. L.; Worledge, D. C.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :10.2.1-10.2.4 Dec, 2022
Conference
Safranski, C.; Hu, G.; Sun, J. Z.; Hashemi, P.; Brown, S. L.; Buzi, L.; D'Emic, C. P.; Edwards, E. R. J.; Galligan, E.; Gottwald, M. G.; Gunawan, O.; Karimeddiny, S.; Jung, H.; Kim, J.; Latzko, K.; Trouilloud, P. L.; Zare, S.; Worledge, D. C.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :288-289 Jun, 2022
Conference
Hu, G.; Lauer, G.; Sun, J. Z.; Hashemi, P.; Safranski, C.; Brown, S. L.; Buzi, L.; Edwards, E. R. J.; D'Emic, C. P.; Galligan, E.; Gottwald, M. G.; Gunawan, O.; Jung, H.; Kim, J.; Latzko, K.; Nowak, J. J.; Trouilloud, P. L.; Zare, S.; Worledge, D. C.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.5.1-2.5.4 Dec, 2021
Conference
Edelstein, D.; Rizzolo, M.; Sil, D.; Dutta, A.; DeBrosse, J.; Wordeman, M.; Arceo, A.; Chu, I. C.; Demarest, J.; Edwards, E. R. J.; Evarts, E. R.; Fullam, J.; Gasasira, A.; Hu, G.; Iwatake, M.; Johnson, R.; Katragadda, V.; Levin, T.; Li, J.; Liu, Y.; Long, C.; Maffitt, T.; McDermott, S.; Mehta, S.; Mehta, V.; Metzler, D.; Morillo, J.; Nakamura, Y.; Nguyen, S.; Nieves, P.; Pai, V.; Patlolla, R.; Pujari, R.; Southwick, R.; Standaert, T.; van der Straten, O.; Wu, H.; Yang, C.-C.; Houssameddine, D.; Slaughter, J. M.; Worledge, D. C.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :11.5.1-11.5.4 Dec, 2020
Demonstration of narrow switching distributions in STTMRAM arrays for LLC applications at 1x nm node
Conference
Edwards, E. R. J.; Hu, G.; Brown, S. L.; D'Emic, C. P.; Gottwald, M. G.; Hashemi, P.; Jung, H.; Kim, J.; Lauer, G.; Nowak, J. J.; Sun, J. Z.; Suwannasiri, T.; Trouilloud, P. L.; Woo, S.; Worledge, D. C.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :24.4.1-24.4.4 Dec, 2020
Conference
Hu, G.; Nowak, J. J.; Gottwald, M. G.; Brown, S. L.; Doris, B.; D'Emic, C. P.; Hashemi, P.; Houssameddine, D.; He, Q.; Kim, D.; Kim, J.; Kothandaraman, C.; Lauer, G.; Lee, H K; Marchack, N.; Reuter, M.; Robertazzi, R. P.; Sun, J. Z.; Suwannasiri, T.; Trouilloud, P. L.; Woo, S.; Worledge, D. C.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.6.1-2.6.4 Dec, 2019
Conference
Hu, G.; Nowak, J. J.; Lauer, G.; Lee, J. H.; Sun, J. Z.; Harms, J.; Annunziata, A.; Brown, S.; Chen, W.; Kim, Y. H.; Marchack, N.; Murthy, S.; Kothandaraman, C.; O'Sullivan, E. J.; Park, J. H.; Reuter, M.; Robertazzi, R. P.; Trouilloud, P. L.; Zhu, Y.; Worledge, D. C.
2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2017 International Symposium on. :1-2 Apr, 2017
Conference
Sun, J. Z.; Robertazzi, R. P.; Nowak, J. J.; Trouilloud, P. L.; Hu, G.; Gaidis, M. C.; Brown, S. L.; Abraham, D. W.; O'Sullivan, E. J.; Gallagher, W. J.; Worledge, D. C.; Kent, A. D.
69th Device Research Conference Device Research Conference (DRC), 2011 69th Annual. :171-174 Jun, 2011
검색 결과 제한하기
제한된 항목
[AR] Worledge, D. C.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어