학술논문
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Factors affecting the interconnection resistance and yield in multilayer polyimide/copper structures
Academic Journal
Shih, D.-Y.; Yeh, H.L.; Paraszczak, J.; Lewis, J.; Graham, W.; Nunes, S.; Narayan, C.; McGouey, R.; Galligan, E.; Cataldo, J.; Serino, R.; Perfecto, E.; Chang, C.-A.; Deutsch, A.; Rothman, L.; Ritsko, J.J.; Wilczynski, J.S.
IEEE Transactions on Components, Hybrids, and Manufacturing Technology IEEE Trans. Comp., Hybrids, Manufact. Technol. Components, Hybrids, and Manufacturing Technology, IEEE Transactions on. 16(1):74-88 Feb, 1993
Conference
Goodman, D.S.; Ainsworth, T.; Bobroff, N.; Chastang, J.; Doany, F.; Fadi, P.; Lovas, S.; Myer, R.; Rand, R.; Rosenbluth, A.E.; Singh, R.; Surovic, C.; Wilczynski, J.S.
LEOS '92 Conference Proceedings LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting. :141-142 1992
Academic Journal
In: Viral Immunology . (Viral Immunology, May 2017, 30(4):288-297)
Academic Journal
In: IBM Journal of Research and Development . (IBM Journal of Research and Development, January/March 1997, 41(1-2):39-47)
Academic Journal
Deutsch, A.; Kopcsay, G.V.; Ranieri, V.A.; Cataldo, J.K.; Galligan, E.A.; Graham, W.S.; McGouey, R.P.; Nunes, S.L.; Paraszczak, J.R.; Ritsko, J.J.; Serino, R.J.; Shih, D.Y.; Wilczynski, J.S.
In: IBM Journal of Research and Development . (IBM Journal of Research and Development, Jul, 34(4):601-615)
Conference
1967 International Electron Devices Meeting IEDM Tech. Dig. Electron Devices Meeting, 1967 International. :146-146 1967
Academic Journal
In: IBM technical disclosure bulletin . (IBM technical disclosure bulletin, Sep, 27(4 B):2330-2332)
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 15(6):436-436 Jun, 1968
Academic Journal
In: IBM Tech Disclosure Bull . (IBM Tech Disclosure Bull, Oct, 15(5))
Academic Journal
In: Proceedings of the Physical Society . (Proceedings of the Physical Society, 1961, 77(1):17-35)
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제한된 항목
[AR] Wilczynski, J.S.
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