학술논문
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Academic Journal
Guo, Z.; Wiedemer, J.; Kim, Y.; Ramamoorthy, P.S.; Sathyaprasad, P.B.; Shridharan, S.; Kim, D.; Karl, E.
IEEE Solid-State Circuits Letters IEEE Solid-State Circuits Lett. Solid-State Circuits Letters, IEEE. 4:6-9 2021
Academic Journal
In: Telemedicine and e-Health . (Telemedicine and e-Health, December 2021, 27(12):1409-1415)
Academic Journal
In: The Journal of family practice . (The Journal of family practice, 1 January 2021, 70(1):13-19)
Conference
Pae, S.; Ghani, T.; Hattendorf, M.; Hicks, J.; Jopling, J.; Maiz, J.; Mistry, K.; O'Donnell, J.; Prasad, C.; Wiedemer, J.; Xu, J.
2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :499-504 Apr, 2009
Conference
Auth, C.; Cappellani, A.; Chun, J.-S.; Dalis, A.; Davis, A.; Ghani, T.; Glass, G.; Glassman, T.; Harper, M.; Hattendorf, M.; Hentges, P.; Jaloviar, S.; Joshi, S.; Klaus, J.; Kuhn, K.; Lavric, D.; Lu, M.; Mariappan, H.; Mistry, K.; Norris, B.; Rahhal-orabi, N.; Ranade, P.; Sandford, J.; Shifren, L.; Souw, V.; Tone, K.; Tambwe, F.; Thompson, A.; Towner, D.; Troeger, T.; Vandervoorn, P.; Wallace, C.; Wiedemer, J.; Wiegand, C.
2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :128-129 Jun, 2008
Conference
Pae, S.; Agostinelli, M.; Brazier, M.; Chau, R.; Dewey, G.; Ghani, T.; Hattendorf, M.; Hicks, J.; Kavalieros, J.; Kuhn, K.; Kuhn, M.; Maiz, J.; Metz, M.; Mistry, K.; Prasad, C.; Ramey, S.; Roskowski, A.; Sandford, J.; Thomas, C.; Thomas, J.; Wiegand, C.; Wiedemer, J.
2008 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. :352-357 Apr, 2008
Conference
Prasad, C.; Agostinelli, M.; Auth, C.; Brazier, M.; Chau, R.; Dewey, G.; Ghani, T.; Hattendorf, M.; Hicks, J.; Jopling, J.; Kavalieros, J.; Kotlyar, R.; Kuhn, M.; Kuhn, K.; Maiz, J.; McIntyre, B.; Metz, M.; Mistry, K.; Pae, S.; Rachmady, W.; Ramey, S.; Roskowski, A.; Sandford, J.; Thomas, C.; Wiegand, C.; Wiedemer, J.
2008 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. :667-668 Apr, 2008
Conference
Natarajan, S.; Agostinelli, M.; Akbar, S.; Bost, M.; Bowonder, A.; Chikarmane, V.; Chouksey, S.; Dasgupta, A.; Fischer, K.; Fu, Q.; Ghani, T.; Giles, M.; Govindaraju, S.; Grover, R.; Han, W.; Hanken, D.; Haralson, E.; Haran, M.; Heckscher, M.; Heussner, R.; Jain, P.; James, R.; Jhaveri, R.; Jin, I.; Kam, H.; Karl, E.; Kenyon, C.; Liu, M.; Luo, Y.; Mehandru, R.; Morarka, S.; Neiberg, L.; Packan, P.; Paliwal, A.; Parker, C.; Patel, P.; Patel, R.; Pelto, C.; Pipes, L.; Plekhanov, P.; Prince, M.; Rajamani, S.; Sandford, J.; Sell, B.; Sivakumar, S.; Smith, P.; Song, B.; Tone, K.; Troeger, T.; Wiedemer, J.; Yang, M.; Zhang, K.
2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :3.7.1-3.7.3 Dec, 2014
Conference
Guo, Z.; Wiedemer, J.; Kim, Y.; Ramamoorthy, P.S.; Sathyaprasad, P.B.; Shridharan, S.; Kim, D.; Karl, E.
In: IEEE Symposium on VLSI Circuits, Digest of Technical Papers , 2020 IEEE Symposium on VLSI Circuits, VLSI Circuits 2020 - Proceedings. (IEEE Symposium on VLSI Circuits, Digest of Technical Papers, June 2020, 2020-June)
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[AR] Wiedemer, J.
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