학술논문
'학술논문'
에서 검색결과 41건 | 목록
1~10
Conference
Van Etten, Adam; Hogan, Daniel; Manso, Jesus Martinez; Shermeyer, Jacob; Weir, Nicholas; Lewis, Ryan
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2021 IEEE/CVF Conference on. :6394-6403 Jun, 2021
Conference
IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, IGARSS 2020 - 2020 IEEE International. :3920-3923 Sep, 2020
Conference
Shermeyer, Jacob; Hogan, Daniel; Brown, Jason; Van Etten, Adam; Weir, Nicholas; Pacifici, Fabio; Hansch, Ronny; Bastidas, Alexei; Soenen, Scott; Bacastow, Todd; Lewis, Ryan
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) Computer Vision and Pattern Recognition Workshops (CVPRW),2020 IEEE/CVF Conference on. :768-777 Jun, 2020
Conference
Weir, Nicholas; Lindenbaum, David; Bastidas, Alexei; Etten, Adam; Kumar, Varun; Mcpherson, Sean; Shermeyer, Jacob; Tang, Hanlin
2019 IEEE/CVF International Conference on Computer Vision (ICCV) Computer Vision (ICCV), 2019 IEEE/CVF International Conference on. :992-1001 Oct, 2019
Academic Journal
In Journal of Clinical Densitometry January 2014 17(1):91-96
Academic Journal
Wang, Xiaoming; Rigg, Paulo; Sethian, John; Sinclair, Nicholas; Weir, Nicholas; Williams, Brendan; Zhang, Jun; Hawreliak, James; Toyoda, Yoshimasa; Gupta, Yogendra; Li, Yuelin; Broege, Douglas; Bromage, Jake; Earley, Robert; Guy, Dale; Zuegel, Jonathan
Academic Journal
Williams, Michelle; Mirsadraee, Saeed; Dweck, Marc; Weir, Nicholas; Fletcher, Alison; Lucatelli, Christophe; MacGillivray, Tom; Golay, Saroj; Cruden, Nicholas; Henriksen, Peter; Uren, Neal; McKillop, Graham; Lima, João; Reid, John; Beek, Edwin; Patel, Dilip; Newby, David; Williams, Michelle C; Dweck, Marc R; Weir, Nicholas W; et al
Academic Journal
Williams, Michelle; Mirsadraee, Saeed; Dweck, Marc; Weir, Nicholas; Fletcher, Alison; Lucatelli, Christophe; MacGillivray, Tom; Golay, Saroj; Cruden, Nicholas; Henriksen, Peter; Uren, Neal; McKillop, Graham; Lima, João; Reid, John; Beek, Edwin; Patel, Dilip; Newby, David; Williams, Michelle C; Dweck, Marc R; Weir, Nicholas W
Academic Journal
Conference
Proceedings of the second international conference on Information and knowledge management. :527-536
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[AR] Weir, Nicholas
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