학술논문
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Academic Journal
Achkar, J.; Velasco, L.; Weidman, M.P.; Clark, R.F.; Jeong Hwan Kim; Jeong Il Park; Tieren Zhang; Peters, J.E.; Ruehaak, J.; Stumpe, D.; de Vreede, J.P.M.; Wallace, A.M.
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 48(2):169-173 Apr, 1999
Conference
1977 IEEE MTT-S International Microwave Symposium Digest Microwave Symposium Digest, 1977 IEEE MTT-S International. :58-60 1977
Academic Journal
Akaike, M.; Amano, A.; Atia, A.E.; Begemann, G.; Bell, A.B.; Bernick, R.L.; Chang, D.C.; Chao, C.; Chen, M.H.; Cowan, D.A.; Cronson, H.M.; Douville, R.J.; Engen, G.F.; Ganguly, A.K.; Gnerlich, H.R.; Harrison, R.G.; Hoer, C.A.; Ishii, T.; Itoh, T.; Kaji, E.; Knochel, R.; Komarek, E.L.; Kondoh, H.; Kuester, E.F.; Kuwabara, N.; Lee, D.H.; Maekawa, E.; Mercer, P.; Meyer, W.; Mitsui, S.; Mitsui, Y.; Mizushina, S.; Nagai, N.; Nagao, T.; Nakaji, E.M.; Nakatani, M.; Niehenke, E.C.; Nishitani, K.; Ohnishi, K.; Ondria, J.; Ono, K.; Rehnmark, S.; Safi, M.; Sawano, H.; Schunemann, K.; Shuch, H.P.; Snyder, R.V.; Sobhy, M.I.; Speciale, R.A.; Spielman, B.E.; Susman, L.; Weidman, M.P.; Weller, K.P.; Williams, A.E.; Ying, R.S.; Yuan, L.T.
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 25(12):1142-1150 Dec, 1977
Academic Journal
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 25(12):1083-1085 Dec, 1977
Academic Journal
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 38(4):927-929 Aug, 1989
Academic Journal
Clark, R.F.; Achkar, J.; Velasco, L.; Weidman, M.P.; Kim, J.H.; Park, J.I.; Zhang, T.; Peters, J.E.; Ruehaak, J.; Stumpe, D.; De Vreede, J.P.M.; Wallace, A.M.
In: IEEE Transactions on Instrumentation and Measurement . (IEEE Transactions on Instrumentation and Measurement, 1999, 48(2):169-173)
Academic Journal
In: Metrologia . (Metrologia, 1981, 17(1):27-31)
Conference
In: 33rd ARFTG Conference Digest - Spring 1989 , 33rd ARFTG Conference Digest - Spring 1989. (33rd ARFTG Conference Digest - Spring 1989, 1989, :76-88)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 24 October 1985, 544:162-168)
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[AR] Weidman, M.P.
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